Multiprobe Surface Science Systems by Omicron
This facility is a characterization sub-system of the RSXS Endstation, with following capabilities:
- X-ray Photoelectron Spectroscopy (XPS) and Imaging XPS (IXPS)
- Ultraviolet Photoelectron Spectroscopy (UPS)
- Auger Electron Spectroscopy (AES)
- Electron Energy Loss Spectroscopy (EELS)
- Secondary Electron Detection (SED) Imaging
- Scanning Tunneling Microscope (STM), UHV
- Atomic Force Microscope (AFM), UHV
Following sources and detectors are available:
- Analyzer: Omicron SPHERA Energy Analyzer, 0 – 2000 eV, energy resolution 10meV
- Omicron Secondary Electron Detection (SED) System
- X-ray Source: Omicron DAR 400 X-ray Source, Mg / Al anode, 15kV, 20mA emission current
- X-ray Source: Omicron XM1000 Monochromated X-ray Source, Al anode, 15kV, 20mA emission current, energy line width 0.25eV.
- UV Source: HIS 13 High Intensity VUV source, for Helium, Neon, Argon, Krypton, Xenon and Hydrogen, discharge current 300 mA.
- Electron Gun Omicron EKF 1000 Electron Source, 100 – 5000 eV, maximum 10µA, LaB6 filament, spot size 1µm
- Electron Gun for EELS: Kimball Physics ELG-2A, 5 – 2000 eV, 1nA to 10µA, Barium Oxide Cathode, with X/Y deflection
- Flood gun: SPEC FG 15/40
- Omicron VT AFM XA Scanning Probe Microscope
Users with allocated beam time have priority to access this facility. The request to use this system alone should be directed to the Beamline Scientist.