The Secondary Optical Enclosure
(The Endstations)
Diffractometer
Grazing Incidence X-ray diffraction (GIXRD)
Grazing Incidence Wide Angle X-ray Scattering(GIWAXS)
Diffractive Anomalous Fine structure (DAFS)
Thin Film characterization
For more information click the picture or the link above.
XAFS
- Conventional Ion chamber detector and Lytle detector
- 32 element Ge solid state detector
- Low temperature sample environment
- Vortex silicon drift detector
For more information click the picture or the link above.
Microprobe
- KB mirrors, assembled
- Vortex silicon drift detector
For more information click the picture or the link above.
In the Front End and Primary Optical Enclosure
The Superconducting Wiggler
HXMA was the only one of the 7 phase one beamlines at CLS to choose a wiggler. It provides us with a high flux/brilliance at the higher energy levels (20-40keV) which can not be achieved using Undulators. For more information click the picture or the link above.
The Beamline Optics
HXMA's Major optical components include a double crystal monochromator, a toroidal focusing mirror, and a vertical collimating mirror. For more information click the picture or the link above.