The SGM Beamline has two endstation areas situated in an in-line configuration. The first endstation area (EA1) is the Scienta X-Ray Photoemission Endstation. Further down the beamline is the second endstation area (EA2) where the Solid Sample Analysis (SSA) Endstation normally resides. As EA2 is situated at the physical end of the beamline, this endstation area is somewhat modular and is capable of supporting other endstation chambers (for more information, contact the Beamline Staff).

Most experiments on the SGM Beamline tend to utilize the SSA Endstation (image on the right) as it provides a wide variety of capabilities, techniques, and detectors. The SSA Endstation is useful for both High Vaccuum (HV) and Ultra-High Vaccuum (UHV) studies. The nominal pressure range for the endstation is 10^-7 Torr to 10^-9 Torr. Due to the wide pressure range available, the endstation is able to handle organic and soil-science samples in addition to UHV compatible samples. With relatively good customizability, this endstation offers a variety of possible detection methods, including: Total Electron Yield (TEY), Total Fluoresence Yield (FLY) through a Micro-Channel Plate Detector (MCP), Energy-Discriminant Fluoresence Yield (FLY) via a Silicon Drift Detector, X-Ray Excited Optical Luminesence (XEOL) using a Czery-Turner type spectrometer, and Gas-Phase measurements. Additionally, the SSA Endstation has a motorized manipulator arm with available heating and cooling. Upgrades in 2009 have vastly improved the sample loading and transfer system for this endstation. Full descriptions of the endstation's detectors, techniques, and capabilities are listed on the Capabilities Page. Some sample spectra for the afore mentioned detection methods are given below (left to right: NEXAFS absorption, Energy-Discriminant FLY).

The SGM Beamline also offers X-Ray Photoemission Spectroscopy via the XPS Endstation. Equipped with a Scienta SES100 photoemission spectrometer, this endstation is available only for UHV compatible experiments. Upgrades in 2009 have significantly improved both the sample transfer capabilities and the beamline automation options. Shown below is an example XPS spectra.