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Beamline 

SM Beamline Techical Information

 Energy range 130 – 2500 eV
 Source Apple II Elliptically Polarizing Undulator, 75 mm period, 1.6 m long
 Polarization

Linear inclined polarization (-90° to +90°) from 130 – 2500 eV; Circular right & left polarizations from 130 – 1000 eV;   Elliptical polarizations from 1000 – 2500 eV.

 Monochromator Entrance slit-less Plane Grating Monochromator
 Endstations STXM, X-PEEM
 Spectral resolving power (E/∆E) Normal operation = 3000; can reach > 10,000
 STXM 108 ph/s in 50 nm spot, spatial resolution = 30 nm
 X-PEEM 1012 ph/s in 50 µm spot, spatial resolution = 50 nm

  SM beamline optics and gratings specifications

Mirror

Type

Substrate

Coating

M1

Cylindrical

Brazed glidcop

Au

M2

Planar

Brazed glidcop

Pt

M3PEEM

Toroidal

Silicon

Au

M3STXM

Toroidal

Silicon

Au

M4PEEM

Ellipsoidal

Silicon

No coating

Grating

Energy range

(eV)

Line spacing (l/mm)

Substrate

Coating

LowEnergyGrating (LEG)

130–400

250

Glidcop

No coating

MediumEnergyGrating (MEG)

400–1500

500

Glidcop

Au

HighEnergyGrating (HEG)

1500–2500

1250

Glidcop

Au

SM Beamline Related Articles:

  1. K.V. Kaznacheyev, I. Blomqvist, E. Hallin, S. Urquhart, D. Loken, T. Tylisczak, T. Warwick and A.P. Hitchcock, Principles of optical design of the SM beamline at the CLS, A.I.P. Conf. Proc. 705 (2004) 1303-1307.
  2. K.V. Kaznacheyev, Ch. Karunakaran, F. He, M. Sigrist, T. Summers, M. Obst and A.P. Hitchcock, CLS ID-10 Chicane Configuration: From "Simple Sharing" to Extended Performance with High Speed Polarization Switching, Nucl. Inst. Meth. A582 (2007) 103-106
  3. K.V. Kaznatcheev, Ch. Karunakaran, U.D. Lanke, S.G. Urquhart, M. Obst and A.P. Hitchcock, Soft X-ray Spectromicroscopy Beamline at the CLS: commissioning results, Nucl. Inst. Meth. A582 (2007) 96-99